SCANNING ELECTRON MICROSCOPY OF TILIA POLLEN
نویسندگان
چکیده
منابع مشابه
Adaptability of Scanning Electron Microscopy to Studies of Pollen Morphology
We have explored methods to achieve excellent results in study of the pollen grain wall by using only one electron microscope, the scanning electron microscope (SEM). While the secondary electron imaging mode , the most common in use, has great value in characterizing the exine surface it is possible to obtain a more comprehensive representation of pollen grain walls by expanding the capability...
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ژورنال
عنوان ژورنال: New Phytologist
سال: 1971
ISSN: 0028-646X,1469-8137
DOI: 10.1111/j.1469-8137.1971.tb02569.x